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Circuit Testing Based on Fuzzy Sampling with BDD Bases

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dc.contributor.authorPinilla, Elena
dc.contributor.authorFernández Amoros, David José
dc.contributor.authorHeradio Gil, Rubén
dc.coverage.temporal2023
dc.date.accessioned2024-10-11T11:03:36Z
dc.date.available2024-10-11T11:03:36Z
dc.date.issued2023
dc.description.abstractFuzzy testing of integrated circuits is an established technique. Current approaches generate an approximately uniform random sample from a translation of the circuit to Boolean logic. These approaches have serious scalability issues, which become more pressing with the ever-increasing size of circuits. We propose using a base of binary decision diagrams to sample the translations as a soft computing approach. Uniformity is guaranteed by design and scalability is greatly improved. We test our approach against five other state-of-the-art tools and find our tool to outperform all of them, both in terms of performance and scalability.en
dc.description.versionversión final
dc.identifier.citationElena Pinilla, David Fernandez-Amoros, Ruben Heradio. Circuit Testing Based on Fuzzy Sampling with BDD Bases. Hawaii International Conference on System Sciences 2023, DOI: 10.24251/HICSS.2023.194
dc.identifier.doihttps://10.24251/HICSS.2023.194
dc.identifier.isbn978-0-9981331-6-4
dc.identifier.urihttps://hdl.handle.net/20.500.14468/24022
dc.language.isoen
dc.publisherUniversity of Hawaiʻi at Mānoa
dc.relation.centerFacultades y escuelas
dc.relation.congressProceedings of the 56th Hawaii International Conference on System Sciences
dc.relation.departmentIngeniería de Software y Sistemas Informáticos
dc.rightsinfo:eu-repo/semantics/openAccess
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/deed.es
dc.subject33 Ciencias Tecnológicas::3304 Tecnología de los ordenadores
dc.subject.keywordsSAT-samplingen
dc.subject.keywordsFuzzy Samplingen
dc.subject.keywordsIntegrated Circuitsen
dc.subject.keywordsRandom Samplingen
dc.subject.keywordsBinary Decision Diagramsen
dc.titleCircuit Testing Based on Fuzzy Sampling with BDD Baseses
dc.typeartículoes
dc.typejournal articleen
dspace.entity.typePublication
relation.isAuthorOfPublication60bb7374-7021-4fda-b2cb-ef7f923c64f4
relation.isAuthorOfPublication38af03ae-439e-45a8-8383-80340d20f7cb
relation.isAuthorOfPublication.latestForDiscovery60bb7374-7021-4fda-b2cb-ef7f923c64f4
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