Fecha
2023
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Director/a
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Derechos de acceso
info:eu-repo/semantics/openAccess
Título de la revista
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Editor
University of Hawaiʻi at Mānoa
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Resumen
Fuzzy testing of integrated circuits is an established technique. Current approaches generate an approximately uniform random sample from a translation of the circuit to Boolean logic. These approaches have serious scalability issues, which become more pressing with the ever-increasing size of circuits. We propose using a base of binary decision diagrams to sample the translations as a soft computing approach. Uniformity is guaranteed by design and scalability is greatly improved. We test our approach against five other state-of-the-art tools and find our tool to outperform all of them, both in terms of performance and scalability.
Descripción
Categorías UNESCO
Palabras clave
SAT-sampling, Fuzzy Sampling, Integrated Circuits, Random Sampling, Binary Decision Diagrams
Citación
Elena Pinilla, David Fernandez-Amoros, Ruben Heradio. Circuit Testing Based on Fuzzy Sampling with BDD Bases. Hawaii International Conference on System Sciences 2023, DOI: 10.24251/HICSS.2023.194
Centro
E.T.S. de Ingeniería Informática
Departamento
Ingeniería de Software y Sistemas Informáticos