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Characterization of limit cycle oscillations induced by Fixed Threshold Samplers

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dc.contributor.authorMiguel Escrig, Oscar
dc.contributor.authorRomero Pérez, Julio Ariel
dc.contributor.authorSánchez Moreno, José
dc.contributor.authorDormido Bencomo, Sebastián
dc.contributor.orcidhttps://orcid.org/0000-0002-2472-2038
dc.contributor.orcidhttps://orcid.org/0000-0002-2405-8771
dc.date.accessioned2024-05-29T09:18:03Z
dc.date.available2024-05-29T09:18:03Z
dc.date.issued2022-06-17
dc.description.abstractIn this work, a generalized study of the conditions for the appearance of limit cycle oscillations induced by any kind of sampler with multilevel fixed thresholds is presented. These kinds of samplers, which will be referred to as Fixed Threshold Samplers (FTS), are characterized by a series of parameters, which, when selected properly, allow obtaining some of the most used forms of quantization in Event-Based Control (EBC). Because of some sampler characteristics, the obtained limit cycle oscillations can present a bias, therefore, to characterize them the Dual Input Describing Function (DIDF) method is used. The obtained DIDF is analyzed revealing some interesting properties allowing to simplify the robustness analysis. The analysis takes into account the effect of the disturbance and reference signal influence on the system, generally overlooked in DF analysis. Guidelines about how to perform the robustness analysis are given, showing their application through some study cases.en
dc.description.versionversión final
dc.identifier.citationO. Miguel-Escrig, J. -A. Romero-Pérez, J. Sánchez-Moreno and S. Dormido, "Characterization of Limit Cycle Oscillations Induced by Fixed Threshold Samplers," in IEEE Access, vol. 10, pp. 62581-62596, 2022, doi: http://doi.org/10.1109/ACCESS.2022.3182794
dc.identifier.doihttp://doi.org/10.1109/ACCESS.2022.3182794
dc.identifier.issn2169-3536
dc.identifier.urihttps://hdl.handle.net/20.500.14468/22207
dc.journal.titleIEEE Access
dc.journal.volume10
dc.language.isoen
dc.publisherInstitute of Electrical and Electronics Engineers
dc.relation.centerE.T.S. de Ingeniería Informática
dc.relation.departmentInformática y Automática
dc.rightsAtribución 4.0 Internacional
dc.rights.urihttps://creativecommons.org/licenses/by-nc-nd/4.0/deed.es
dc.subject12 Matemáticas::1203 Ciencia de los ordenadores ::1203.17 Informática
dc.subject.keywordsDIDFen
dc.subject.keywordslimit cycleen
dc.subject.keywordsrobustnessen
dc.subject.keywordssamplingen
dc.titleCharacterization of limit cycle oscillations induced by Fixed Threshold Samplersen
dc.typeartículoes
dc.typejournal articleen
dspace.entity.typePublication
relation.isAuthorOfPublicationcafb43c8-2038-4e5c-a3b3-f53b9fc7f8c1
relation.isAuthorOfPublication.latestForDiscoverycafb43c8-2038-4e5c-a3b3-f53b9fc7f8c1
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