Examinando por Autor "Pinilla, Elena"
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Publicación Circuit Testing Based on Fuzzy Sampling with BDD Bases(University of Hawaiʻi at Mānoa, 2023) Pinilla, Elena; Fernández Amoros, David José; Heradio Gil, RubénFuzzy testing of integrated circuits is an established technique. Current approaches generate an approximately uniform random sample from a translation of the circuit to Boolean logic. These approaches have serious scalability issues, which become more pressing with the ever-increasing size of circuits. We propose using a base of binary decision diagrams to sample the translations as a soft computing approach. Uniformity is guaranteed by design and scalability is greatly improved. We test our approach against five other state-of-the-art tools and find our tool to outperform all of them, both in terms of performance and scalability.