Pinilla, ElenaFernández Amoros, David JoséHeradio Gil, Rubén2024-10-112024-10-112023Elena Pinilla, David Fernandez-Amoros, Ruben Heradio. Circuit Testing Based on Fuzzy Sampling with BDD Bases. Hawaii International Conference on System Sciences 2023, DOI: 10.24251/HICSS.2023.194978-0-9981331-6-4https://10.24251/HICSS.2023.194https://hdl.handle.net/20.500.14468/24022Fuzzy testing of integrated circuits is an established technique. Current approaches generate an approximately uniform random sample from a translation of the circuit to Boolean logic. These approaches have serious scalability issues, which become more pressing with the ever-increasing size of circuits. We propose using a base of binary decision diagrams to sample the translations as a soft computing approach. Uniformity is guaranteed by design and scalability is greatly improved. We test our approach against five other state-of-the-art tools and find our tool to outperform all of them, both in terms of performance and scalability.eninfo:eu-repo/semantics/openAccess33 Ciencias Tecnológicas::3304 Tecnología de los ordenadoresartículoSAT-samplingFuzzy SamplingIntegrated CircuitsRandom SamplingBinary Decision Diagrams